IEC/PAS 62201 Ed. 1.0 en:2000 PDF

Describes an algorithm for executing of the Standard Wafer Level Electromigration Accelerated Test (SWEAT) on computer controlled instrumentation. The algorithm described represents one approach to the execution of SWEAT. Development and employment of other algorithms may produce satisfactory accelerated electromigration test results.

Edition :	1.0
Note :	This product is unavailable in Canada
Number of Pages :	22
Published :	11/28/2000